%0 Journal Article %1 journals/mr/ZhangZCWK14 %A Zhang, Meng %A Zhou, Wei %A Chen, Rongsheng %A Wong, Man %A Kwok, Hoi-Sing %D 2014 %J Microelectronics Reliability %K dblp %N 1 %P 30-32 %T Water-enhanced negative bias temperature instability in p-type low temperature polycrystalline silicon thin film transistors. %U http://dblp.uni-trier.de/db/journals/mr/mr54.html#ZhangZCWK14 %V 54

@article{journals/mr/ZhangZCWK14, added-at = {2014-08-06T00:00:00.000+0200}, author = {Zhang, Meng and Zhou, Wei and Chen, Rongsheng and Wong, Man and Kwok, Hoi-Sing}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2899a1c39f0b099ea01557dbc86059202/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2013.07.082}, interhash = {59bb96dd3e880af7be0a31354795f18c}, intrahash = {899a1c39f0b099ea01557dbc86059202}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = 1, pages = {30-32}, timestamp = {2016-02-02T02:02:10.000+0100}, title = {Water-enhanced negative bias temperature instability in p-type low temperature polycrystalline silicon thin film transistors.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr54.html#ZhangZCWK14}, volume = 54, year = 2014 }