%0 Journal Article %1 journals/mr/QinZCHL18 %A Qin, Qi %A Zhao, Shuai %A Chen, Shaowei %A Huang, Dengshan %A Liang, Jian %D 2018 %J Microelectronics Reliability %K dblp %P 64-74 %T Adaptive and robust prediction for the remaining useful life of electrolytic capacitors. %U http://dblp.uni-trier.de/db/journals/mr/mr87.html#QinZCHL18 %V 87

@article{journals/mr/QinZCHL18, added-at = {2018-08-11T00:00:00.000+0200}, author = {Qin, Qi and Zhao, Shuai and Chen, Shaowei and Huang, Dengshan and Liang, Jian}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/27e63c91841032b1a9278cdf1a590d873/dblp}, ee = {https://doi.org/10.1016/j.microrel.2018.05.020}, interhash = {5866139321108db89768026183d342e3}, intrahash = {7e63c91841032b1a9278cdf1a590d873}, journal = {Microelectronics Reliability}, keywords = {dblp}, pages = {64-74}, timestamp = {2019-09-27T10:58:24.000+0200}, title = {Adaptive and robust prediction for the remaining useful life of electrolytic capacitors.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr87.html#QinZCHL18}, volume = 87, year = 2018 }