%0 Journal Article %1 journals/mr/AkarvardarMSSCGC07 %A Akarvardar, Kerem %A Mercha, Abdelkarim %A Simoen, Eddy %A Subramanian, Vaidyanathan %A Claeys, Cor %A Gentil, Pierre %A Cristoloveanu, Sorin %D 2007 %J Microelectronics Reliability %K dblp %N 12 %P 2065-2069 %T High-temperature performance of state-of-the-art triple-gate transistors. %U http://dblp.uni-trier.de/db/journals/mr/mr47.html#AkarvardarMSSCGC07 %V 47

@article{journals/mr/AkarvardarMSSCGC07, added-at = {2010-09-17T00:00:00.000+0200}, author = {Akarvardar, Kerem and Mercha, Abdelkarim and Simoen, Eddy and Subramanian, Vaidyanathan and Claeys, Cor and Gentil, Pierre and Cristoloveanu, Sorin}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2c4bc3041e61823ee2dc8d3933a8ed024/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2006.10.002}, interhash = {54ae20b1a4d3d3c75f2a3f08ffb6a2ec}, intrahash = {c4bc3041e61823ee2dc8d3933a8ed024}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = 12, pages = {2065-2069}, timestamp = {2016-02-02T02:00:31.000+0100}, title = {High-temperature performance of state-of-the-art triple-gate transistors.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr47.html#AkarvardarMSSCGC07}, volume = 47, year = 2007 }