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%0 Journal Article
%1 journals/mr/OhyamaSKCTHKNS01
%A Ohyama, Hidenori
%A Simoen, Eddy
%A Kuroda, S.
%A Claeys, Cor
%A Takami, Y.
%A Hakata, T.
%A Kobayashi, K.
%A Nakabayashi, M.
%A Sunaga, H.
%D 2001
%J Microelectronics Reliability
%K dblp
%N 1
%P 79-85
%T Degradation and recovery of AlGaAs/GaAs p-HEMT irradiated by high-energy particle.
%U http://dblp.uni-trier.de/db/journals/mr/mr41.html#OhyamaSKCTHKNS01
%V 41
@article{journals/mr/OhyamaSKCTHKNS01,
added-at = {2015-02-05T00:00:00.000+0100},
author = {Ohyama, Hidenori and Simoen, Eddy and Kuroda, S. and Claeys, Cor and Takami, Y. and Hakata, T. and Kobayashi, K. and Nakabayashi, M. and Sunaga, H.},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/26608fac795fafdfc1a9b306fca982ba6/dblp},
ee = {http://dx.doi.org/10.1016/S0026-2714(00)00073-1},
interhash = {5439695a15818d47565f6a2c618500e9},
intrahash = {6608fac795fafdfc1a9b306fca982ba6},
journal = {Microelectronics Reliability},
keywords = {dblp},
number = 1,
pages = {79-85},
timestamp = {2016-02-02T01:59:43.000+0100},
title = {Degradation and recovery of AlGaAs/GaAs p-HEMT irradiated by high-energy particle.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr41.html#OhyamaSKCTHKNS01},
volume = 41,
year = 2001
}
