%0 Journal Article %1 journals/mr/CaiYTZCLZ15 %A Cai, Miao %A Yang, Dao-Guo %A Tian, Kunmiao %A Zhang, Ping %A Chen, Xianping %A Liu, Lilin %A Zhang, Guoqi %D 2015 %J Microelectronics Reliability %K dblp %N 9-10 %P 1784-1789 %T Step-stress accelerated testing of high-power LED lamps based on subsystem isolation method. %U http://dblp.uni-trier.de/db/journals/mr/mr55.html#CaiYTZCLZ15 %V 55

@article{journals/mr/CaiYTZCLZ15, added-at = {2019-09-25T00:00:00.000+0200}, author = {Cai, Miao and Yang, Dao-Guo and Tian, Kunmiao and Zhang, Ping and Chen, Xianping and Liu, Lilin and Zhang, Guoqi}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/24d13a3d1fe501f6b77f93abe4d3c1ced/dblp}, ee = {https://doi.org/10.1016/j.microrel.2015.06.147}, interhash = {52fc8b290a871a8e21bcac3a8de779f9}, intrahash = {4d13a3d1fe501f6b77f93abe4d3c1ced}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {9-10}, pages = {1784-1789}, timestamp = {2019-09-27T10:58:20.000+0200}, title = {Step-stress accelerated testing of high-power LED lamps based on subsystem isolation method.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr55.html#CaiYTZCLZ15}, volume = 55, year = 2015 }