%0 Journal Article %1 journals/mr/UsuiIHKH05 %A Usui, Masanori %A Ishiko, Masayasu %A Hotta, Koji %A Kuwano, Satoshi %A Hashimoto, Masato %D 2005 %J Microelectronics Reliability %K dblp %N 9-11 %P 1682-1687 %T Effects of uni-axial mechanical stress on IGBT characteristics. %U http://dblp.uni-trier.de/db/journals/mr/mr45.html#UsuiIHKH05 %V 45

@article{journals/mr/UsuiIHKH05, added-at = {2007-03-27T00:00:00.000+0200}, author = {Usui, Masanori and Ishiko, Masayasu and Hotta, Koji and Kuwano, Satoshi and Hashimoto, Masato}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2398a40187bbe5637f8cf4a87dae5865d/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2005.07.078}, interhash = {4f8f59d4671feb0d4a612a9516ac5667}, intrahash = {398a40187bbe5637f8cf4a87dae5865d}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {9-11}, pages = {1682-1687}, timestamp = {2016-02-02T02:01:50.000+0100}, title = {Effects of uni-axial mechanical stress on IGBT characteristics.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr45.html#UsuiIHKH05}, volume = 45, year = 2005 }