Please log in to take part in the discussion (add own reviews or comments).
Cite this publication
More citation styles
- please select -
%0 Journal Article
%1 journals/et/KimKH08
%A Kim, Hong-Sik
%A Kang, Sungho
%A Hsiao, Michael S.
%D 2008
%J J. Electronic Testing
%K dblp
%N 4
%P 365-378
%T A New Scan Architecture for Both Low Power Testing and Test Volume Compression Under SOC Test Environment.
%U http://dblp.uni-trier.de/db/journals/et/et24.html#KimKH08
%V 24
@article{journals/et/KimKH08,
added-at = {2009-03-22T00:00:00.000+0100},
author = {Kim, Hong-Sik and Kang, Sungho and Hsiao, Michael S.},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2a123010a56494b65523a0cae15df9462/dblp},
ee = {http://dx.doi.org/10.1007/s10836-008-5062-6},
interhash = {4cbc46c90092661f0cc662e91c675b6e},
intrahash = {a123010a56494b65523a0cae15df9462},
journal = {J. Electronic Testing},
keywords = {dblp},
number = 4,
pages = {365-378},
timestamp = {2016-02-02T10:07:29.000+0100},
title = {A New Scan Architecture for Both Low Power Testing and Test Volume Compression Under SOC Test Environment.},
url = {http://dblp.uni-trier.de/db/journals/et/et24.html#KimKH08},
volume = 24,
year = 2008
}