%0 Journal Article %1 journals/dt/LuLNH10 %A Lu, Darsen D. %A Lin, Chung-Hsun %A Niknejad, Ali M. %A Hu, Chenming %D 2010 %J IEEE Design & Test of Computers %K dblp %N 2 %P 44-50 %T Compact Modeling of Variation in FinFET SRAM Cells. %U http://dblp.uni-trier.de/db/journals/dt/dt27.html#LuLNH10 %V 27

@article{journals/dt/LuLNH10, added-at = {2016-03-09T00:00:00.000+0100}, author = {Lu, Darsen D. and Lin, Chung-Hsun and Niknejad, Ali M. and Hu, Chenming}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/23994af6e0303b714964ed6a416c0fda3/dblp}, ee = {http://doi.ieeecomputersociety.org/10.1109/MDT.2010.39}, interhash = {4c5599893bdb4e7fdd53388dee46f320}, intrahash = {3994af6e0303b714964ed6a416c0fda3}, journal = {IEEE Design & Test of Computers}, keywords = {dblp}, number = 2, pages = {44-50}, timestamp = {2016-03-10T11:20:17.000+0100}, title = {Compact Modeling of Variation in FinFET SRAM Cells.}, url = {http://dblp.uni-trier.de/db/journals/dt/dt27.html#LuLNH10}, volume = 27, year = 2010 }