%0 Journal Article %1 journals/mr/YeLWNZ18 %A Ye, Xuerong %A Lin, Yigang %A Wang, Qingmin %A Niu, Hao %A Zhai, Guofu %D 2018 %J Microelectronics Reliability %K dblp %P 107-110 %T Manufacturing process-based storage degradation modelling and reliability assessment. %U http://dblp.uni-trier.de/db/journals/mr/mr88.html#YeLWNZ18 %V 88-90

@article{journals/mr/YeLWNZ18, added-at = {2019-01-07T00:00:00.000+0100}, author = {Ye, Xuerong and Lin, Yigang and Wang, Qingmin and Niu, Hao and Zhai, Guofu}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/22fd28349cfe2ece299dfd71a01edd6d2/dblp}, ee = {https://doi.org/10.1016/j.microrel.2018.06.085}, interhash = {493e46d0bf7a8d1dfa8879a6f277153d}, intrahash = {2fd28349cfe2ece299dfd71a01edd6d2}, journal = {Microelectronics Reliability}, keywords = {dblp}, pages = {107-110}, timestamp = {2019-09-27T10:58:36.000+0200}, title = {Manufacturing process-based storage degradation modelling and reliability assessment.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr88.html#YeLWNZ18}, volume = {88-90}, year = 2018 }