%0 Journal Article %1 journals/mr/GaoB08 %A Gao, Liming %A Burmer, Christian %D 2008 %J Microelectronics Reliability %K dblp %N 8-9 %P 1349-1353 %T PLL soft functional failure analysis in advanced logic product using fault based analogue simulation and soft defect localization. %U http://dblp.uni-trier.de/db/journals/mr/mr48.html#GaoB08 %V 48

@article{journals/mr/GaoB08, added-at = {2010-09-27T00:00:00.000+0200}, author = {Gao, Liming and Burmer, Christian}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/27de3f70a605f7f7deadd02eb6c9d6c81/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2008.06.012}, interhash = {46e21aa389f08fc5939955992c249abd}, intrahash = {7de3f70a605f7f7deadd02eb6c9d6c81}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {8-9}, pages = {1349-1353}, timestamp = {2016-02-02T02:02:17.000+0100}, title = {PLL soft functional failure analysis in advanced logic product using fault based analogue simulation and soft defect localization.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr48.html#GaoB08}, volume = 48, year = 2008 }