%0 Journal Article %1 journals/mr/VassilevJGVTHNSM03 %A Vassilev, Vesselin K. %A Jenei, Snezana %A Groeseneken, Guido %A Venegas, Rafael %A Thijs, Steven %A Heyn, Vincent De %A Iyer, M. Natarajan %A Steyaert, Michiel %A Maes, H. E. %D 2003 %J Microelectronics Reliability %K dblp %N 7 %P 1011-1020 %T High frequency characterization and modelling of the parasitic RC performance of two terminal ESD CMOS protection devices. %U http://dblp.uni-trier.de/db/journals/mr/mr43.html#VassilevJGVTHNSM03 %V 43

@article{journals/mr/VassilevJGVTHNSM03, added-at = {2016-03-18T00:00:00.000+0100}, author = {Vassilev, Vesselin K. and Jenei, Snezana and Groeseneken, Guido and Venegas, Rafael and Thijs, Steven and Heyn, Vincent De and Iyer, M. Natarajan and Steyaert, Michiel and Maes, H. E.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/29183ffcf9f51b068c5528bccb8426075/dblp}, ee = {http://dx.doi.org/10.1016/S0026-2714(03)00129-X}, interhash = {4686f7b16c5aa7caed7c4f17cde01b7a}, intrahash = {9183ffcf9f51b068c5528bccb8426075}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = 7, pages = {1011-1020}, timestamp = {2016-03-19T10:31:52.000+0100}, title = {High frequency characterization and modelling of the parasitic RC performance of two terminal ESD CMOS protection devices.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr43.html#VassilevJGVTHNSM03}, volume = 43, year = 2003 }