%0 Conference Paper %1 conf/IEEEares/MayerS17 %A Mayer, Felix %A Steinebach, Martin %B ARES %D 2017 %I ACM %K dblp %P 53:1-53:9 %T Forensic Image Inspection Assisted by Deep Learning. %U http://dblp.uni-trier.de/db/conf/IEEEares/ares2017.html#MayerS17 %@ 978-1-4503-5257-4

@inproceedings{conf/IEEEares/MayerS17, added-at = {2018-11-06T00:00:00.000+0100}, author = {Mayer, Felix and Steinebach, Martin}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2c4717fc3e4eec57ee7f3eff706aec71a/dblp}, booktitle = {ARES}, crossref = {conf/IEEEares/2017}, ee = {https://doi.org/10.1145/3098954.3104051}, interhash = {45c172b6f767a844077662eca1a9e623}, intrahash = {c4717fc3e4eec57ee7f3eff706aec71a}, isbn = {978-1-4503-5257-4}, keywords = {dblp}, pages = {53:1-53:9}, publisher = {ACM}, timestamp = {2019-09-27T21:08:26.000+0200}, title = {Forensic Image Inspection Assisted by Deep Learning.}, url = {http://dblp.uni-trier.de/db/conf/IEEEares/ares2017.html#MayerS17}, year = 2017 }