%0 Journal Article %1 journals/mr/BottiniCGGGMSS07 %A Bottini, R. %A Costantini, S. %A Galbiati, N. %A Ghetti, Andrea %A Ghidini, G. %A Mauri, A. %A Scozzari, C. %A Sebastiani, A. %D 2007 %J Microelectronics Reliability %K dblp %N 9-11 %P 1384-1388 %T High voltage transistor degradation in NVM pump application. %U http://dblp.uni-trier.de/db/journals/mr/mr47.html#BottiniCGGGMSS07 %V 47

@article{journals/mr/BottiniCGGGMSS07, added-at = {2019-01-21T00:00:00.000+0100}, author = {Bottini, R. and Costantini, S. and Galbiati, N. and Ghetti, Andrea and Ghidini, G. and Mauri, A. and Scozzari, C. and Sebastiani, A.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2728df6db1fdfa9e9fbdc86f08652ecd4/dblp}, ee = {https://doi.org/10.1016/j.microrel.2007.07.050}, interhash = {456f88c1be865ed94cb12159957989e4}, intrahash = {728df6db1fdfa9e9fbdc86f08652ecd4}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {9-11}, pages = {1384-1388}, timestamp = {2019-09-27T10:58:34.000+0200}, title = {High voltage transistor degradation in NVM pump application.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr47.html#BottiniCGGGMSS07}, volume = 47, year = 2007 }