Please log in to take part in the discussion (add own reviews or comments).
Cite this publication
More citation styles
- please select -
%0 Journal Article
%1 journals/mr/CowleyIWBDGCVWM16
%A Cowley, A.
%A Ivankovic, Andrej
%A Wong, C. S.
%A Bennett, N. S.
%A Danilewsky, A. N.
%A Gonzalez, Marcel
%A Cherman, Vladimir
%A Vandevelde, Bart
%A Wolf, Ingrid De
%A McNally, P. J.
%D 2016
%J Microelectronics Reliability
%K dblp
%P 108-116
%T B-Spline X-Ray Diffraction Imaging - Rapid non-destructive measurement of die warpage in ball grid array packages.
%U http://dblp.uni-trier.de/db/journals/mr/mr59.html#CowleyIWBDGCVWM16
%V 59
@article{journals/mr/CowleyIWBDGCVWM16,
added-at = {2016-05-10T00:00:00.000+0200},
author = {Cowley, A. and Ivankovic, Andrej and Wong, C. S. and Bennett, N. S. and Danilewsky, A. N. and Gonzalez, Marcel and Cherman, Vladimir and Vandevelde, Bart and Wolf, Ingrid De and McNally, P. J.},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/275442fdbdde10e7deb2aea4d7b5fbb5c/dblp},
ee = {http://dx.doi.org/10.1016/j.microrel.2015.12.030},
interhash = {445317a5ee177f50258366f4de5e6e3a},
intrahash = {75442fdbdde10e7deb2aea4d7b5fbb5c},
journal = {Microelectronics Reliability},
keywords = {dblp},
pages = {108-116},
timestamp = {2016-05-11T09:31:55.000+0200},
title = {B-Spline X-Ray Diffraction Imaging - Rapid non-destructive measurement of die warpage in ball grid array packages.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr59.html#CowleyIWBDGCVWM16},
volume = 59,
year = 2016
}