%0 Journal Article %1 journals/tc/ThatteA80 %A Thatte, Satish M. %A Abraham, Jacob A. %D 1980 %J IEEE Trans. Computers %K dblp %N 6 %P 429-441 %T Test Generation for Microprocessors. %U http://dblp.uni-trier.de/db/journals/tc/tc29.html#ThatteA80 %V 29

@article{journals/tc/ThatteA80, added-at = {2015-12-22T00:00:00.000+0100}, author = {Thatte, Satish M. and Abraham, Jacob A.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/23adfe59bc6144aa45e416d558b1e05b7/dblp}, ee = {http://doi.ieeecomputersociety.org/10.1109/TC.1980.1675602}, interhash = {4359be271b2df96d645ad67c41080ba3}, intrahash = {3adfe59bc6144aa45e416d558b1e05b7}, journal = {IEEE Trans. Computers}, keywords = {dblp}, number = 6, pages = {429-441}, timestamp = {2016-02-02T02:38:04.000+0100}, title = {Test Generation for Microprocessors.}, url = {http://dblp.uni-trier.de/db/journals/tc/tc29.html#ThatteA80}, volume = 29, year = 1980 }