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%0 Journal Article
%1 Schnitzler_PCIM2025
%A Schnitzler, R.
%A Koch, D.
%A Kallfass, I.
%D 2025
%J in Proc. PCIM Europe Conference
%K PUMA in update
%T 10 MHz Accelerated Gate-Switching Stress Tests Utilizing In-Situ Degradation Monitoring for SiC MOSFETs
@article{Schnitzler_PCIM2025,
added-at = {2025-05-26T10:46:09.000+0200},
author = {Schnitzler, R. and Koch, D. and Kallfass, I.},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/25fe7a1ff0a7f7587a315147552ce017e/ingmarkallfass},
date-added = {2024-10-15 07:55:11 +0200},
date-modified = {2024-10-15 07:55:34 +0200},
interhash = {3f472ea86cbaa995e21490410e0118cf},
intrahash = {5fe7a1ff0a7f7587a315147552ce017e},
journal = {in Proc. PCIM Europe Conference},
keywords = {PUMA in update},
timestamp = {2025-05-26T10:46:09.000+0200},
title = {10 MHz Accelerated Gate-Switching Stress Tests Utilizing In-Situ Degradation Monitoring for SiC MOSFETs},
year = 2025
}
