%0 Journal Article %1 journals/mr/ChangBXLLC13 %A Chang, Sung-Jae %A Bawedin, Maryline %A Xiong, Wade %A Lee, Jong-Hyun %A Lee, Jung-Hee %A Cristoloveanu, Sorin %D 2013 %J Microelectronics Reliability %K dblp %N 3 %P 386-393 %T Remote carrier trapping in FinFETs with ONO buried layer: Temperature effects. %U http://dblp.uni-trier.de/db/journals/mr/mr53.html#ChangBXLLC13 %V 53

@article{journals/mr/ChangBXLLC13, added-at = {2013-04-11T00:00:00.000+0200}, author = {Chang, Sung-Jae and Bawedin, Maryline and Xiong, Wade and Lee, Jong-Hyun and Lee, Jung-Hee and Cristoloveanu, Sorin}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2b8b59a8cfc82d547661362e625e2c68c/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2012.10.002}, interhash = {3cf1c7a554ebac38d20f5a862d32f615}, intrahash = {b8b59a8cfc82d547661362e625e2c68c}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = 3, pages = {386-393}, timestamp = {2016-02-02T02:01:50.000+0100}, title = {Remote carrier trapping in FinFETs with ONO buried layer: Temperature effects.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr53.html#ChangBXLLC13}, volume = 53, year = 2013 }