%0 Conference Paper %1 conf/date/NairBT18 %A Nair, Sarath Mohanachandran %A Bishnoi, Rajendra %A Tahoori, Mehdi Baradaran %B DATE %D 2018 %E Madsen, Jan %E Coskun, Ayse K. %I IEEE %K dblp %P 265-268 %T Parametric failure modeling and yield analysis for STT-MRAM. %U http://dblp.uni-trier.de/db/conf/date/date2018.html#NairBT18 %@ 978-3-9819263-0-9

@inproceedings{conf/date/NairBT18, added-at = {2018-04-24T00:00:00.000+0200}, author = {Nair, Sarath Mohanachandran and Bishnoi, Rajendra and Tahoori, Mehdi Baradaran}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2f50c9bb50d5f9c72930bbd816fe01564/dblp}, booktitle = {DATE}, crossref = {conf/date/2018}, editor = {Madsen, Jan and Coskun, Ayse K.}, ee = {https://doi.org/10.23919/DATE.2018.8342016}, interhash = {3ba019b7cf3c9f3a836499484020e8b6}, intrahash = {f50c9bb50d5f9c72930bbd816fe01564}, isbn = {978-3-9819263-0-9}, keywords = {dblp}, pages = {265-268}, publisher = {IEEE}, timestamp = {2019-09-27T13:35:55.000+0200}, title = {Parametric failure modeling and yield analysis for STT-MRAM.}, url = {http://dblp.uni-trier.de/db/conf/date/date2018.html#NairBT18}, year = 2018 }