%0 Journal Article %1 journals/mr/SauterW10 %A Sauter, Martin %A Willemen, Joost %D 2010 %J Microelectronics Reliability %K dblp %N 2 %P 183-189 %T Simulation and modelling of VDMOSFET self protection under TLP-stress. %U http://dblp.uni-trier.de/db/journals/mr/mr50.html#SauterW10 %V 50

@article{journals/mr/SauterW10, added-at = {2010-09-29T00:00:00.000+0200}, author = {Sauter, Martin and Willemen, Joost}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2df4ea480444b6bf5a04934ff45a2acb5/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2009.10.007}, interhash = {3ad35cc5b7347cf630767394a5c9ebac}, intrahash = {df4ea480444b6bf5a04934ff45a2acb5}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = 2, pages = {183-189}, timestamp = {2016-02-02T02:02:35.000+0100}, title = {Simulation and modelling of VDMOSFET self protection under TLP-stress.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr50.html#SauterW10}, volume = 50, year = 2010 }