%0 Journal Article %1 journals/mr/LeeRBBGL04 %A Lee, Simone %A Ramadoss, Ramesh %A Buck, Michael %A Bright, V. M. %A Gupta, K. C. %A Lee, Y. C. %D 2004 %J Microelectronics Reliability %K dblp %N 2 %P 245-250 %T Reliability testing of flexible printed circuit-based RF MEMS capacitive switches. %U http://dblp.uni-trier.de/db/journals/mr/mr44.html#LeeRBBGL04 %V 44

@article{journals/mr/LeeRBBGL04, added-at = {2007-03-26T00:00:00.000+0200}, author = {Lee, Simone and Ramadoss, Ramesh and Buck, Michael and Bright, V. M. and Gupta, K. C. and Lee, Y. C.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2a2bc9509e21a33151b6c4bb82a5db0f6/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2003.09.002}, interhash = {3a27cc6246a037bbf77d3ab14f003dd7}, intrahash = {a2bc9509e21a33151b6c4bb82a5db0f6}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = 2, pages = {245-250}, timestamp = {2016-02-02T02:02:32.000+0100}, title = {Reliability testing of flexible printed circuit-based RF MEMS capacitive switches.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr44.html#LeeRBBGL04}, volume = 44, year = 2004 }