%0 Journal Article %1 journals/mr/KimKNCF12 %A Kim, Jiseok %A Krishnan, Siddarth A. %A Narayanan, Sudarshan %A Chudzik, Michael P. %A Fischetti, Massimo V. %D 2012 %J Microelectronics Reliability %K dblp %N 12 %P 2907-2913 %T Thickness and temperature dependence of the leakage current in hafnium-based Si SOI MOSFETs. %U http://dblp.uni-trier.de/db/journals/mr/mr52.html#KimKNCF12 %V 52

@article{journals/mr/KimKNCF12, added-at = {2012-11-22T00:00:00.000+0100}, author = {Kim, Jiseok and Krishnan, Siddarth A. and Narayanan, Sudarshan and Chudzik, Michael P. and Fischetti, Massimo V.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2f768d28dd86c0b005f634dfa90b79bf4/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2012.06.151}, interhash = {36d0f0b39b1f07a930ec327106fc7ed7}, intrahash = {f768d28dd86c0b005f634dfa90b79bf4}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = 12, pages = {2907-2913}, timestamp = {2016-02-02T02:02:28.000+0100}, title = {Thickness and temperature dependence of the leakage current in hafnium-based Si SOI MOSFETs.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr52.html#KimKNCF12}, volume = 52, year = 2012 }