%0 Journal Article %1 journals/mj/QianLSS11 %A Qian, Qinsong %A Liu, Siyang %A Sun, Weifeng %A Sun, Hu %D 2011 %J Microelectronics Journal %K dblp %N 5 %P 609-613 %T Threshold voltage degradation under high Vgs and low Vds on 200 V SOI power devices. %U http://dblp.uni-trier.de/db/journals/mj/mj42.html#QianLSS11 %V 42

@article{journals/mj/QianLSS11, added-at = {2011-05-24T00:00:00.000+0200}, author = {Qian, Qinsong and Liu, Siyang and Sun, Weifeng and Sun, Hu}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/290b4ebe20fd50ab0f5160d5c00250fac/dblp}, ee = {http://dx.doi.org/10.1016/j.mejo.2011.03.011}, interhash = {35dacb8737c95209992f7ba002408df2}, intrahash = {90b4ebe20fd50ab0f5160d5c00250fac}, journal = {Microelectronics Journal}, keywords = {dblp}, number = 5, pages = {609-613}, timestamp = {2016-02-02T06:51:29.000+0100}, title = {Threshold voltage degradation under high Vgs and low Vds on 200 V SOI power devices.}, url = {http://dblp.uni-trier.de/db/journals/mj/mj42.html#QianLSS11}, volume = 42, year = 2011 }