%0 Journal Article %1 journals/mr/ZhangTTYZ04 %A Zhang, Guan %A Tan, Cher Ming %A Tan, Kok Tong %A Ye, Derek Sim Kwang %A Zhang, W. Y. %D 2004 %J Microelectronics Reliability %K dblp %N 9-11 %P 1843-1848 %T Reliability Improvement in Al Metallization: A Combination of Statistical Prediction and Failure Analytical Methodology. %U http://dblp.uni-trier.de/db/journals/mr/mr44.html#ZhangTTYZ04 %V 44

@article{journals/mr/ZhangTTYZ04, added-at = {2015-02-05T00:00:00.000+0100}, author = {Zhang, Guan and Tan, Cher Ming and Tan, Kok Tong and Ye, Derek Sim Kwang and Zhang, W. Y.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/21067e2a085b8c0ee8fa822df264ac929/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2004.07.095}, interhash = {33cd6b84eadfb4aa519f076c1fa3b401}, intrahash = {1067e2a085b8c0ee8fa822df264ac929}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {9-11}, pages = {1843-1848}, timestamp = {2016-02-02T02:02:25.000+0100}, title = {Reliability Improvement in Al Metallization: A Combination of Statistical Prediction and Failure Analytical Methodology.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr44.html#ZhangTTYZ04}, volume = 44, year = 2004 }