%0 Journal Article %1 journals/mj/HalderC05 %A Halder, Achintya %A Chatterjee, Abhijit %D 2005 %J Microelectronics Journal %K dblp %N 9 %P 820-832 %T Test generation for specification test of analog circuits using efficient test response observation methods. %U http://dblp.uni-trier.de/db/journals/mj/mj36.html#HalderC05 %V 36

@article{journals/mj/HalderC05, added-at = {2007-03-26T00:00:00.000+0200}, author = {Halder, Achintya and Chatterjee, Abhijit}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2a374ab27f12723c2edab74cdf62aea12/dblp}, ee = {http://dx.doi.org/10.1016/j.mejo.2005.03.005}, interhash = {328a580ac60d5d48eeb35dcc546238a7}, intrahash = {a374ab27f12723c2edab74cdf62aea12}, journal = {Microelectronics Journal}, keywords = {dblp}, number = 9, pages = {820-832}, timestamp = {2016-02-02T06:51:33.000+0100}, title = {Test generation for specification test of analog circuits using efficient test response observation methods.}, url = {http://dblp.uni-trier.de/db/journals/mj/mj36.html#HalderC05}, volume = 36, year = 2005 }