%0 Journal Article %1 journals/tvlsi/SwahnH08 %A Swahn, Brian %A Hassoun, Soha %D 2008 %J IEEE Trans. VLSI Syst. %K dblp %N 7 %P 816-829 %T Electro-Thermal Analysis of Multi-Fin Devices. %U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi16.html#SwahnH08 %V 16

@article{journals/tvlsi/SwahnH08, added-at = {2009-01-31T00:00:00.000+0100}, author = {Swahn, Brian and Hassoun, Soha}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2e60e953f9e97b32c4915bae90fe95c6a/dblp}, ee = {http://dx.doi.org/10.1109/TVLSI.2008.2000455}, interhash = {32873ac779bc6fcf51e714a8051bc13c}, intrahash = {e60e953f9e97b32c4915bae90fe95c6a}, journal = {IEEE Trans. VLSI Syst.}, keywords = {dblp}, number = 7, pages = {816-829}, timestamp = {2016-02-02T02:12:13.000+0100}, title = {Electro-Thermal Analysis of Multi-Fin Devices.}, url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi16.html#SwahnH08}, volume = 16, year = 2008 }