%0 Journal Article %1 journals/mr/PapeSCKW12 %A Pape, Heinz %A Schweitzer, Dirk %A Chen, Liu %A Kutscherauer, Rudolf %A Walder, Martin %D 2012 %J Microelectronics Reliability %K dblp %N 7 %P 1272-1278 %T Development of a standard for transient measurement of junction-to-case thermal resistance. %U http://dblp.uni-trier.de/db/journals/mr/mr52.html#PapeSCKW12 %V 52

@article{journals/mr/PapeSCKW12, added-at = {2012-06-21T00:00:00.000+0200}, author = {Pape, Heinz and Schweitzer, Dirk and Chen, Liu and Kutscherauer, Rudolf and Walder, Martin}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2ef75f8c1b81ec13cbdbfc8a2e8fce82b/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2012.03.017}, interhash = {3085d01eaf8d54e7da712f96e228c8db}, intrahash = {ef75f8c1b81ec13cbdbfc8a2e8fce82b}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = 7, pages = {1272-1278}, timestamp = {2016-02-02T02:00:31.000+0100}, title = {Development of a standard for transient measurement of junction-to-case thermal resistance.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr52.html#PapeSCKW12}, volume = 52, year = 2012 }