%0 Journal Article %1 journals/mr/NeugroschelBC07 %A Neugroschel, Arnost %A Bersuker, Gennadi %A Choi, Rino %D 2007 %J Microelectronics Reliability %K dblp %N 9-11 %P 1366-1372 %T Applications of DCIV method to NBTI characterization. %U http://dblp.uni-trier.de/db/journals/mr/mr47.html#NeugroschelBC07 %V 47

@article{journals/mr/NeugroschelBC07, added-at = {2010-09-16T00:00:00.000+0200}, author = {Neugroschel, Arnost and Bersuker, Gennadi and Choi, Rino}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/22b26a7c30d61e1700ff66b182dbbcfc1/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2007.07.037}, interhash = {2fb2233b3eb9ae8ca3c9d0c84f883a1a}, intrahash = {2b26a7c30d61e1700ff66b182dbbcfc1}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {9-11}, pages = {1366-1372}, timestamp = {2016-02-02T02:01:07.000+0100}, title = {Applications of DCIV method to NBTI characterization.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr47.html#NeugroschelBC07}, volume = 47, year = 2007 }