%0 Journal Article %1 journals/mr/ChenGDBWMBT06 %A Chen, L. %A Guy, O. J. %A Doneddu, D. %A Batcup, S. G. J. %A Wilks, S. P. %A Mawby, P. A. %A Bouchet, T. %A Torregrosa, F. %D 2006 %J Microelectronics Reliability %K dblp %N 2-4 %P 637-640 %T Report on 4H-SiC JTE Schottky diodes. %U http://dblp.uni-trier.de/db/journals/mr/mr46.html#ChenGDBWMBT06 %V 46

@article{journals/mr/ChenGDBWMBT06, added-at = {2007-03-27T00:00:00.000+0200}, author = {Chen, L. and Guy, O. J. and Doneddu, D. and Batcup, S. G. J. and Wilks, S. P. and Mawby, P. A. and Bouchet, T. and Torregrosa, F.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2b182ca1f474fcecb26de04ed2b34b847/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2005.07.006}, interhash = {2e1082fa7295981f3d9d86d0b92cf958}, intrahash = {b182ca1f474fcecb26de04ed2b34b847}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {2-4}, pages = {637-640}, timestamp = {2016-02-02T02:00:13.000+0100}, title = {Report on 4H-SiC JTE Schottky diodes.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr46.html#ChenGDBWMBT06}, volume = 46, year = 2006 }