%0 Journal Article %1 journals/mr/LiuSRVDMW11 %A Liu, Rui %A Schreurs, Dominique M. M.-P. %A Raedt, Walter De %A Vanaverbeke, Frederik %A Das, J. %A Mertens, Robert P. %A Wolf, Ingrid De %D 2011 %J Microelectronics Reliability %K dblp %N 9-11 %P 1721-1724 %T Electrical characterization and reliability study of integrated GaN power amplifier in multi-layer thin-film technology. %U http://dblp.uni-trier.de/db/journals/mr/mr51.html#LiuSRVDMW11 %V 51

@article{journals/mr/LiuSRVDMW11, added-at = {2019-07-10T00:00:00.000+0200}, author = {Liu, Rui and Schreurs, Dominique M. M.-P. and Raedt, Walter De and Vanaverbeke, Frederik and Das, J. and Mertens, Robert P. and Wolf, Ingrid De}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/28a25ddfbd5dd0aeafc6cbd9742050c68/dblp}, ee = {https://doi.org/10.1016/j.microrel.2011.06.034}, interhash = {2b8b5e5fa237a53e40000bf1d452c711}, intrahash = {8a25ddfbd5dd0aeafc6cbd9742050c68}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {9-11}, pages = {1721-1724}, timestamp = {2019-09-27T10:58:08.000+0200}, title = {Electrical characterization and reliability study of integrated GaN power amplifier in multi-layer thin-film technology.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr51.html#LiuSRVDMW11}, volume = 51, year = 2011 }