%0 Journal Article %1 journals/mr/EntnerGTEM07 %A Entner, Robert %A Grasser, Tibor %A Triebl, Oliver %A Enichlmair, Hubert %A Minixhofer, Rainer %D 2007 %J Microelectronics Reliability %K dblp %N 4-5 %P 697-699 %T Negative bias temperature instability modeling for high-voltage oxides at different stress temperatures. %U http://dblp.uni-trier.de/db/journals/mr/mr47.html#EntnerGTEM07 %V 47

@article{journals/mr/EntnerGTEM07, added-at = {2010-09-15T00:00:00.000+0200}, author = {Entner, Robert and Grasser, Tibor and Triebl, Oliver and Enichlmair, Hubert and Minixhofer, Rainer}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/24ed0555dfd30a61cbc9a37e502eed886/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2007.01.078}, interhash = {28a3370a831506204a175aa6326a6d15}, intrahash = {4ed0555dfd30a61cbc9a37e502eed886}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {4-5}, pages = {697-699}, timestamp = {2016-02-02T01:59:47.000+0100}, title = {Negative bias temperature instability modeling for high-voltage oxides at different stress temperatures.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr47.html#EntnerGTEM07}, volume = 47, year = 2007 }