%0 Journal Article %1 journals/tcad/GebregiorgisBT19 %A Gebregiorgis, Anteneh %A Bishnoi, Rajendra %A Tahoori, Mehdi Baradaran %D 2019 %J IEEE Trans. on CAD of Integrated Circuits and Systems %K dblp %N 3 %P 439-452 %T A Comprehensive Reliability Analysis Framework for NTC Caches: A System to Device Approach. %U http://dblp.uni-trier.de/db/journals/tcad/tcad38.html#GebregiorgisBT19 %V 38

@article{journals/tcad/GebregiorgisBT19, added-at = {2019-04-12T00:00:00.000+0200}, author = {Gebregiorgis, Anteneh and Bishnoi, Rajendra and Tahoori, Mehdi Baradaran}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2ab747eb8f5dd2a3b24491a19e9ed7ab2/dblp}, ee = {https://doi.org/10.1109/TCAD.2018.2818691}, interhash = {289d811a392b384fa0569f36992836b4}, intrahash = {ab747eb8f5dd2a3b24491a19e9ed7ab2}, journal = {IEEE Trans. on CAD of Integrated Circuits and Systems}, keywords = {dblp}, number = 3, pages = {439-452}, timestamp = {2019-09-27T08:26:45.000+0200}, title = {A Comprehensive Reliability Analysis Framework for NTC Caches: A System to Device Approach.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad38.html#GebregiorgisBT19}, volume = 38, year = 2019 }