%0 Journal Article %1 journals/mr/PodgaynayaREPGSS10 %A Podgaynaya, A. %A Rudolf, Ralf %A Elattari, B. %A Pogany, Dionyz %A Gornik, Erich %A Stecher, Matthias %A Strasser, Marc %D 2010 %J Microelectronics Reliability %K dblp %N 9-11 %P 1347-1351 %T Single pulse energy capability and failure modes of n- and p-channel LDMOS with thick copper metallization. %U http://dblp.uni-trier.de/db/journals/mr/mr50.html#PodgaynayaREPGSS10 %V 50

@article{journals/mr/PodgaynayaREPGSS10, added-at = {2015-03-03T00:00:00.000+0100}, author = {Podgaynaya, A. and Rudolf, Ralf and Elattari, B. and Pogany, Dionyz and Gornik, Erich and Stecher, Matthias and Strasser, Marc}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/29007cbf023c88744ebda58d33a03d1d3/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2010.07.075}, interhash = {25be55f324c8f67eb49475dfe708f089}, intrahash = {9007cbf023c88744ebda58d33a03d1d3}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {9-11}, pages = {1347-1351}, timestamp = {2016-02-02T02:02:32.000+0100}, title = {Single pulse energy capability and failure modes of n- and p-channel LDMOS with thick copper metallization.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr50.html#PodgaynayaREPGSS10}, volume = 50, year = 2010 }