%0 Journal Article %1 journals/mr/WangCH11 %A Wang, Ying %A Cheng, Chao %A fan Hu, Hai %D 2011 %J Microelectronics Reliability %K dblp %N 2 %P 513-516 %T Investigation of power Trench MOSFETs with retrograde body profile. %U http://dblp.uni-trier.de/db/journals/mr/mr51.html#WangCH11 %V 51

@article{journals/mr/WangCH11, added-at = {2011-04-21T00:00:00.000+0200}, author = {Wang, Ying and Cheng, Chao and fan Hu, Hai}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2a645b5334b1e3dcac6b1e85b870f6e80/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2010.08.008}, interhash = {213fd4f033b6f7f08de08da829d78835}, intrahash = {a645b5334b1e3dcac6b1e85b870f6e80}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = 2, pages = {513-516}, timestamp = {2016-02-02T02:00:57.000+0100}, title = {Investigation of power Trench MOSFETs with retrograde body profile.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr51.html#WangCH11}, volume = 51, year = 2011 }