%0 Journal Article %1 journals/mr/ZhangZFASRG14 %A Zhang, Cher Xuan %A xia Zhang, En %A Fleetwood, Daniel M. %A Alles, Michael L. %A Schrimpf, Ronald D. %A Rutherglen, Chris %A Galatsis, Kosmas %D 2014 %J Microelectronics Reliability %K dblp %N 11 %P 2355-2359 %T Total-ionizing-dose effects and reliability of carbon nanotube FET devices. %U http://dblp.uni-trier.de/db/journals/mr/mr54.html#ZhangZFASRG14 %V 54

@article{journals/mr/ZhangZFASRG14, added-at = {2015-03-26T00:00:00.000+0100}, author = {Zhang, Cher Xuan and xia Zhang, En and Fleetwood, Daniel M. and Alles, Michael L. and Schrimpf, Ronald D. and Rutherglen, Chris and Galatsis, Kosmas}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2c8b8490cb8555311b34585ab51cebd36/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2014.05.011}, interhash = {20c2a52d31f047b2b98a3e4d63e2c61b}, intrahash = {c8b8490cb8555311b34585ab51cebd36}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = 11, pages = {2355-2359}, timestamp = {2016-02-02T01:59:36.000+0100}, title = {Total-ionizing-dose effects and reliability of carbon nanotube FET devices.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr54.html#ZhangZFASRG14}, volume = 54, year = 2014 }