%0 Journal Article %1 journals/mj/LiuCLK15 %A Liu, Baojun %A Cai, Li %A Li, Yan %A Kang, Qiang %D 2015 %J Microelectronics Journal %K dblp %N 1 %P 20-26 %T Reliability for nanomagnetic logic (NML) readout circuit under single event effect. %U http://dblp.uni-trier.de/db/journals/mj/mj46.html#LiuCLK15 %V 46

@article{journals/mj/LiuCLK15, added-at = {2015-01-19T00:00:00.000+0100}, author = {Liu, Baojun and Cai, Li and Li, Yan and Kang, Qiang}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/202db8c40e6ddc8a03dc5b40d2df9594c/dblp}, ee = {http://dx.doi.org/10.1016/j.mejo.2014.09.014}, interhash = {1f321a13787dadf79c6854e868c28eaa}, intrahash = {02db8c40e6ddc8a03dc5b40d2df9594c}, journal = {Microelectronics Journal}, keywords = {dblp}, number = 1, pages = {20-26}, timestamp = {2016-02-02T06:51:29.000+0100}, title = {Reliability for nanomagnetic logic (NML) readout circuit under single event effect.}, url = {http://dblp.uni-trier.de/db/journals/mj/mj46.html#LiuCLK15}, volume = 46, year = 2015 }