Please log in to take part in the discussion (add own reviews or comments).
Cite this publication
More citation styles
- please select -
%0 Journal Article
%1 journals/mr/YuanMYH10
%A Yuan, J. S.
%A Ma, J.
%A Yeh, W. K.
%A Hsu, C. W.
%D 2010
%J Microelectronics Reliability
%K dblp
%N 6
%P 807-812
%T Impact of strain on hot electron reliability of dual-band power amplifier and integrated LNA-mixer RF performances.
%U http://dblp.uni-trier.de/db/journals/mr/mr50.html#YuanMYH10
%V 50
@article{journals/mr/YuanMYH10,
added-at = {2010-09-29T00:00:00.000+0200},
author = {Yuan, J. S. and Ma, J. and Yeh, W. K. and Hsu, C. W.},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2d5de34904d9d6bc4fcccad6e83f638b8/dblp},
ee = {http://dx.doi.org/10.1016/j.microrel.2010.02.019},
interhash = {1e20b150fbbf359df0e4ea052817121c},
intrahash = {d5de34904d9d6bc4fcccad6e83f638b8},
journal = {Microelectronics Reliability},
keywords = {dblp},
number = 6,
pages = {807-812},
timestamp = {2016-02-02T02:01:35.000+0100},
title = {Impact of strain on hot electron reliability of dual-band power amplifier and integrated LNA-mixer RF performances.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr50.html#YuanMYH10},
volume = 50,
year = 2010
}
