Bitte melden Sie sich an um selbst Rezensionen oder Kommentare zu erstellen.
Zitieren Sie diese Publikation
Mehr Zitationsstile
- bitte auswählen -
%0 Conference Paper
%1 conf/isqed/OhYD02
%A young Oh, Tae
%A Yu, Zhiping
%A Dutton, Robert W.
%B ISQED
%D 2002
%I IEEE Computer Society
%K dblp
%P 326-330
%T AC Analysis of Thin Gate Oxide MOS with Quantum Mechanical Corrections.
%U http://dblp.uni-trier.de/db/conf/isqed/isqed2002.html#OhYD02
%@ 0-7695-1561-4
@inproceedings{conf/isqed/OhYD02,
added-at = {2014-09-26T00:00:00.000+0200},
author = {young Oh, Tae and Yu, Zhiping and Dutton, Robert W.},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2320ff3e7be0bfc35a8480aea14b5873e/dblp},
booktitle = {ISQED},
crossref = {conf/isqed/2002},
ee = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2002.996767},
interhash = {1d459ccf213b49c47c28637669303f49},
intrahash = {320ff3e7be0bfc35a8480aea14b5873e},
isbn = {0-7695-1561-4},
keywords = {dblp},
pages = {326-330},
publisher = {IEEE Computer Society},
timestamp = {2016-02-02T13:52:52.000+0100},
title = {AC Analysis of Thin Gate Oxide MOS with Quantum Mechanical Corrections.},
url = {http://dblp.uni-trier.de/db/conf/isqed/isqed2002.html#OhYD02},
year = 2002
}