%0 Conference Paper %1 conf/irps/HuangMKYSWBK19 %A Huang, H. %A McLaughin, P. S. %A Kelly, J. J. %A Yang, C.-C. %A Southwick, R. G. %A Wang, M. %A Bonilla, G. %A Karve, G. %B IRPS %D 2019 %I IEEE %K dblp %P 1-5 %T Time Dependent Dielectric Breakdown of Cobalt and Ruthenium Interconnects at 36nm Pitch. %U http://dblp.uni-trier.de/db/conf/irps/irps2019.html#HuangMKYSWBK19 %@ 978-1-5386-9504-3

@inproceedings{conf/irps/HuangMKYSWBK19, added-at = {2019-05-31T00:00:00.000+0200}, author = {Huang, H. and McLaughin, P. S. and Kelly, J. J. and Yang, C.-C. and Southwick, R. G. and Wang, M. and Bonilla, G. and Karve, G.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2fbceedaae0602867cea05fa086682d76/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2019}, ee = {https://doi.org/10.1109/IRPS.2019.8720528}, interhash = {1d1a1055d08025ab1e229979d613d1fa}, intrahash = {fbceedaae0602867cea05fa086682d76}, isbn = {978-1-5386-9504-3}, keywords = {dblp}, pages = {1-5}, publisher = {IEEE}, timestamp = {2019-09-27T13:33:20.000+0200}, title = {Time Dependent Dielectric Breakdown of Cobalt and Ruthenium Interconnects at 36nm Pitch.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2019.html#HuangMKYSWBK19}, year = 2019 }