%0 Conference Paper %1 conf/ats/ChoiHV00 %A Choi, Wooyoung %A Harjani, Ramesh %A Vinnakota, Bapiraju %B Asian Test Symposium %D 2000 %I IEEE Computer Society %K dblp %P 72-77 %T Optimal test-set generation for parametric fault detection in switched capacitor filters. %U http://dblp.uni-trier.de/db/conf/ats/ats2000.html#ChoiHV00 %@ 0-7695-0887-1

@inproceedings{conf/ats/ChoiHV00, added-at = {2016-01-13T00:00:00.000+0100}, author = {Choi, Wooyoung and Harjani, Ramesh and Vinnakota, Bapiraju}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/26c209aad100240eea288a302cc221d1d/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2000}, ee = {http://doi.ieeecomputersociety.org/10.1109/ATS.2000.893605}, interhash = {1b0acde8cabf5e0f37668e2a14424ab3}, intrahash = {6c209aad100240eea288a302cc221d1d}, isbn = {0-7695-0887-1}, keywords = {dblp}, pages = {72-77}, publisher = {IEEE Computer Society}, timestamp = {2016-02-02T14:23:16.000+0100}, title = {Optimal test-set generation for parametric fault detection in switched capacitor filters.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2000.html#ChoiHV00}, year = 2000 }