%0 Conference Paper %1 conf/depcos/MicskeiM06 %A Micskei, Zoltán %A Majzik, István %B DepCoS-RELCOMEX %D 2006 %I IEEE Computer Society %K dblp %P 191-198 %T Model-based Automatic Test Generation for Event-Driven Embedded Systems using Model Checkers. %U http://dblp.uni-trier.de/db/conf/depcos/depcos2006.html#MicskeiM06 %@ 0-7695-2565-2

@inproceedings{conf/depcos/MicskeiM06, added-at = {2014-10-09T00:00:00.000+0200}, author = {Micskei, Zoltán and Majzik, István}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/274f1ea517121d3d294b2ff29d3794e9a/dblp}, booktitle = {DepCoS-RELCOMEX}, crossref = {conf/depcos/2006}, ee = {http://doi.ieeecomputersociety.org/10.1109/DEPCOS-RELCOMEX.2006.37}, interhash = {189c98cdf7ca135a868b3e2bb1f4d9a5}, intrahash = {74f1ea517121d3d294b2ff29d3794e9a}, isbn = {0-7695-2565-2}, keywords = {dblp}, pages = {191-198}, publisher = {IEEE Computer Society}, timestamp = {2016-02-02T11:16:55.000+0100}, title = {Model-based Automatic Test Generation for Event-Driven Embedded Systems using Model Checkers.}, url = {http://dblp.uni-trier.de/db/conf/depcos/depcos2006.html#MicskeiM06}, year = 2006 }