%0 Journal Article %1 journals/ieicet/AliasKSMH13 %A Alias, Nurul Ezaila %A Kumar, Anil %A Saraya, Takuya %A Miyano, Shinji %A Hiramoto, Toshiro %D 2013 %J IEICE Transactions %K dblp %N 5 %P 620-623 %T NBTI Reliability of PFETs under Post-Fabrication Self-Improvement Scheme for SRAM. %U http://dblp.uni-trier.de/db/journals/ieicet/ieicet96c.html#AliasKSMH13 %V 96-C

@article{journals/ieicet/AliasKSMH13, added-at = {2018-09-28T00:00:00.000+0200}, author = {Alias, Nurul Ezaila and Kumar, Anil and Saraya, Takuya and Miyano, Shinji and Hiramoto, Toshiro}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2f019a47c3a5f1b0e523cc82b16e574ed/dblp}, ee = {http://search.ieice.org/bin/summary.php?id=e96-c_5_620}, interhash = {1889337ed4b925dbaf948ac49dffcb8f}, intrahash = {f019a47c3a5f1b0e523cc82b16e574ed}, journal = {IEICE Transactions}, keywords = {dblp}, number = 5, pages = {620-623}, timestamp = {2019-09-27T07:11:20.000+0200}, title = {NBTI Reliability of PFETs under Post-Fabrication Self-Improvement Scheme for SRAM.}, url = {http://dblp.uni-trier.de/db/journals/ieicet/ieicet96c.html#AliasKSMH13}, volume = {96-C}, year = 2013 }