%0 Journal Article %1 journals/mr/YoungHNCLB07 %A Young, Chadwin D. %A Heh, Dawei %A Neugroschel, Arnost %A Choi, Rino %A Lee, Byoung Hun %A Bersuker, Gennadi %D 2007 %J Microelectronics Reliability %K dblp %N 4-5 %P 479-488 %T Electrical characterization and analysis techniques for the high-kappa era. %U http://dblp.uni-trier.de/db/journals/mr/mr47.html#YoungHNCLB07 %V 47

@article{journals/mr/YoungHNCLB07, added-at = {2010-09-15T00:00:00.000+0200}, author = {Young, Chadwin D. and Heh, Dawei and Neugroschel, Arnost and Choi, Rino and Lee, Byoung Hun and Bersuker, Gennadi}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/21044371affc2439d7cdaf61abbedc46a/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2007.01.053}, interhash = {18865fb854b560c4d1ca8123ba961b28}, intrahash = {1044371affc2439d7cdaf61abbedc46a}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {4-5}, pages = {479-488}, timestamp = {2016-02-02T02:02:25.000+0100}, title = {Electrical characterization and analysis techniques for the high-kappa era.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr47.html#YoungHNCLB07}, volume = 47, year = 2007 }