%0 Journal Article %1 journals/mr/CovaMDFJ02 %A Cova, Paolo %A Menozzi, Roberto %A Dammann, Maximilian %A Feltgen, T. %A Jantz, W. %D 2002 %J Microelectronics Reliability %K dblp %N 9-11 %P 1587-1592 %T High-field step-stress and long term stability of PHEMTs with different gate and recess lengths. %U http://dblp.uni-trier.de/db/journals/mr/mr42.html#CovaMDFJ02 %V 42

@article{journals/mr/CovaMDFJ02, added-at = {2019-06-30T00:00:00.000+0200}, author = {Cova, Paolo and Menozzi, Roberto and Dammann, Maximilian and Feltgen, T. and Jantz, W.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/290f02c2f12dd17e0d5a07648a460a889/dblp}, ee = {https://doi.org/10.1016/S0026-2714(02)00195-6}, interhash = {1618f53cbfa533bae0e76a6c3e6b8aed}, intrahash = {90f02c2f12dd17e0d5a07648a460a889}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {9-11}, pages = {1587-1592}, timestamp = {2019-09-27T10:58:10.000+0200}, title = {High-field step-stress and long term stability of PHEMTs with different gate and recess lengths.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr42.html#CovaMDFJ02}, volume = 42, year = 2002 }