%0 Journal Article %1 journals/tcad/EldibWTS15 %A Eldib, Hassan %A Wang, Chao %A Taha, Mostafa M. I. %A Schaumont, Patrick %D 2015 %J IEEE Trans. on CAD of Integrated Circuits and Systems %K dblp %N 10 %P 1558-1568 %T Quantitative Masking Strength: Quantifying the Power Side-Channel Resistance of Software Code. %U http://dblp.uni-trier.de/db/journals/tcad/tcad34.html#EldibWTS15 %V 34

@article{journals/tcad/EldibWTS15, added-at = {2015-09-23T00:00:00.000+0200}, author = {Eldib, Hassan and Wang, Chao and Taha, Mostafa M. I. and Schaumont, Patrick}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/29c3849770eeb391b5821da921f6d9d06/dblp}, ee = {http://dx.doi.org/10.1109/TCAD.2015.2424951}, interhash = {122f8a458e0987eaf05df3109b6767d7}, intrahash = {9c3849770eeb391b5821da921f6d9d06}, journal = {IEEE Trans. on CAD of Integrated Circuits and Systems}, keywords = {dblp}, number = 10, pages = {1558-1568}, timestamp = {2016-11-04T10:33:13.000+0100}, title = {Quantitative Masking Strength: Quantifying the Power Side-Channel Resistance of Software Code.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad34.html#EldibWTS15}, volume = 34, year = 2015 }