%0 Journal Article %1 journals/mr/ZhangW10 %A Zhang, Meng %A Wang, Mingxiang %D 2010 %J Microelectronics Reliability %K dblp %N 5 %P 713-716 %T An investigation of drain pulse induced hot carrier degradation in n-type low temperature polycrystalline silicon thin film transistors. %U http://dblp.uni-trier.de/db/journals/mr/mr50.html#ZhangW10 %V 50

@article{journals/mr/ZhangW10, added-at = {2010-09-29T00:00:00.000+0200}, author = {Zhang, Meng and Wang, Mingxiang}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2ad40688392badce2931d7049a2628362/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2010.01.024}, interhash = {11bad4208a5e96e17f62ea7527cc586e}, intrahash = {ad40688392badce2931d7049a2628362}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = 5, pages = {713-716}, timestamp = {2016-02-02T02:00:01.000+0100}, title = {An investigation of drain pulse induced hot carrier degradation in n-type low temperature polycrystalline silicon thin film transistors.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr50.html#ZhangW10}, volume = 50, year = 2010 }