%0 Journal Article %1 journals/mr/KovacRMRRA08 %A Kovac, Urban %A Reid, Dave %A Millar, Campbell %A Roy, Gareth %A Roy, Scott %A Asenov, Asen %D 2008 %J Microelectronics Reliability %K dblp %N 8-9 %P 1572-1575 %T Statistical simulation of random dopant induced threshold voltage fluctuations for 35 nm channel length MOSFET. %U http://dblp.uni-trier.de/db/journals/mr/mr48.html#KovacRMRRA08 %V 48

@article{journals/mr/KovacRMRRA08, added-at = {2010-09-27T00:00:00.000+0200}, author = {Kovac, Urban and Reid, Dave and Millar, Campbell and Roy, Gareth and Roy, Scott and Asenov, Asen}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2daf5b634b695762e973b07e83413f516/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2008.06.027}, interhash = {119b22e588abfb94282a03c8194901ed}, intrahash = {daf5b634b695762e973b07e83413f516}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {8-9}, pages = {1572-1575}, timestamp = {2016-02-02T01:59:50.000+0100}, title = {Statistical simulation of random dopant induced threshold voltage fluctuations for 35 nm channel length MOSFET.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr48.html#KovacRMRRA08}, volume = 48, year = 2008 }