%0 Conference Paper %1 conf/aspdac/FangS11 %A Fang, Jianxin %A Sapatnekar, Sachin S. %B ASP-DAC %D 2011 %I IEEE %K dblp %P 689-694 %T Accounting for inherent circuit resilience and process variations in analyzing gate oxide reliability. %U http://dblp.uni-trier.de/db/conf/aspdac/aspdac2011.html#FangS11 %@ 978-1-4244-7516-2

@inproceedings{conf/aspdac/FangS11, added-at = {2018-11-02T00:00:00.000+0100}, author = {Fang, Jianxin and Sapatnekar, Sachin S.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2473a4029dd6f597d7f2271536cef7962/dblp}, booktitle = {ASP-DAC}, crossref = {conf/aspdac/2011}, ee = {http://dl.acm.org/citation.cfm?id=1950948}, interhash = {116a1152eec86ad610a8aefe530655f0}, intrahash = {473a4029dd6f597d7f2271536cef7962}, isbn = {978-1-4244-7516-2}, keywords = {dblp}, pages = {689-694}, publisher = {IEEE}, timestamp = {2019-09-27T19:23:02.000+0200}, title = {Accounting for inherent circuit resilience and process variations in analyzing gate oxide reliability.}, url = {http://dblp.uni-trier.de/db/conf/aspdac/aspdac2011.html#FangS11}, year = 2011 }