%0 Journal Article %1 journals/mj/MateoAA07 %A Mateo, Diego %A Altet, Josep %A Aldrete-Vidrio, Eduardo %D 2007 %J Microelectronics Journal %K dblp %N 2 %P 151-156 %T Electrical characterization of analogue and RF integrated circuits by thermal measurements. %U http://dblp.uni-trier.de/db/journals/mj/mj38.html#MateoAA07 %V 38

@article{journals/mj/MateoAA07, added-at = {2011-06-14T00:00:00.000+0200}, author = {Mateo, Diego and Altet, Josep and Aldrete-Vidrio, Eduardo}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/29f8907de8a29687b5a7df7c1130db293/dblp}, ee = {http://dx.doi.org/10.1016/j.mejo.2006.08.003}, interhash = {10deef437214bbc84b7b075ebe9cd7a8}, intrahash = {9f8907de8a29687b5a7df7c1130db293}, journal = {Microelectronics Journal}, keywords = {dblp}, number = 2, pages = {151-156}, timestamp = {2016-02-02T06:52:25.000+0100}, title = {Electrical characterization of analogue and RF integrated circuits by thermal measurements.}, url = {http://dblp.uni-trier.de/db/journals/mj/mj38.html#MateoAA07}, volume = 38, year = 2007 }