%0 Conference Paper %1 conf/irps/SchlunderWRLRUG19 %A Schlünder, Christian %A Waschneck, Katja %A Rotter, Peter %A Lachenmann, Susanne %A Reisinger, Hans %A Ungar, Franz %A Georgakos, Georg %B IRPS %D 2019 %I IEEE %K dblp %P 1-12 %T From Device Aging Physics to Automated Circuit Reliability Sign Off. %U http://dblp.uni-trier.de/db/conf/irps/irps2019.html#SchlunderWRLRUG19 %@ 978-1-5386-9504-3

@inproceedings{conf/irps/SchlunderWRLRUG19, added-at = {2019-05-31T00:00:00.000+0200}, author = {Schlünder, Christian and Waschneck, Katja and Rotter, Peter and Lachenmann, Susanne and Reisinger, Hans and Ungar, Franz and Georgakos, Georg}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2a4203de810694587a0522f032972b11b/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2019}, ee = {https://doi.org/10.1109/IRPS.2019.8720457}, interhash = {0e4e65dea8b0e4560e4aa0330faa8d3c}, intrahash = {a4203de810694587a0522f032972b11b}, isbn = {978-1-5386-9504-3}, keywords = {dblp}, pages = {1-12}, publisher = {IEEE}, timestamp = {2019-09-27T13:33:20.000+0200}, title = {From Device Aging Physics to Automated Circuit Reliability Sign Off.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2019.html#SchlunderWRLRUG19}, year = 2019 }