%0 Journal Article %1 journals/mr/BenstetterRH02 %A Benstetter, Guenther %A Ruprecht, Michael W. %A Hunt, Douglas B. %D 2002 %J Microelectronics Reliability %K dblp %N 3 %P 307-316 %T A review of ULSI failure analysis techniques for DRAMs 1. Defect localization and verification. %U http://dblp.uni-trier.de/db/journals/mr/mr42.html#BenstetterRH02 %V 42

@article{journals/mr/BenstetterRH02, added-at = {2007-03-25T00:00:00.000+0100}, author = {Benstetter, Guenther and Ruprecht, Michael W. and Hunt, Douglas B.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/283183a80a0f0307046cf78369d5cd6fc/dblp}, ee = {http://dx.doi.org/10.1016/S0026-2714(02)00002-1}, interhash = {0dce9de6295b98c34263ce9ff006a9be}, intrahash = {83183a80a0f0307046cf78369d5cd6fc}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = 3, pages = {307-316}, timestamp = {2016-02-02T02:01:50.000+0100}, title = {A review of ULSI failure analysis techniques for DRAMs 1. Defect localization and verification.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr42.html#BenstetterRH02}, volume = 42, year = 2002 }